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Instruction Based BIST for Board/System Level Test of External Memories and Internconnects.

Olivier CatyIsmet BayraktarogluAmitava MajumdarRichard LeeJohn BellLisa Curhan
Published in: ITC (2003)
Keyphrases
  • built in self test
  • levels of abstraction
  • data sets
  • information systems
  • higher level
  • test cases
  • computer technology
  • internal and external
  • database
  • decision trees
  • cooperative learning