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First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel.
Ansh
Gaurav Sheoran
Jeevesh Kumar
Mayank Shrivastava
Published in:
IRPS (2020)
Keyphrases
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infrared
multi channel
data driven
data mining
multiple access
real time
travel time
communication channels
finite element analysis
failure prediction
stress distribution
solder ball connect
wireless channels
failure rate
noisy channel
electrical properties