Deterministic BIST with Partial Scan.

Gundolf Kiefer Hans-Joachim Wunderlich

Published in: J. Electron. Test. (2000)

Keyphrases

black box
preprocessing
scan data
learning algorithm
randomized algorithms
data structure
connected component labeling
recursive functions
range data
medical images
databases
three dimensional
decision making
computer vision
machine learning
data mining
neural network