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Exponential convergence bounds in least squares estimation: Identification of viscoelastic properties in atomic force microscopy.

Michael R. P. RagazzonJan Tommy GravdahlKristin Ytterstad Pettersen
Published in: CCTA (2017)
Keyphrases
  • atomic force microscopy
  • upper bound
  • linear complexity
  • information retrieval
  • artificial intelligence
  • computer vision
  • lower bound
  • cost function
  • worst case
  • tight bounds
  • rates of convergence