Login / Signup

Ongoing Research on Adaptive Layered Manufacturing from Overtraced Freehand Sketch.

Natthavika ChansriPisut Koomsap
Published in: ISPE CE (2010)
Keyphrases
  • quality control
  • neural network
  • real world
  • database systems
  • data structure
  • probabilistic model
  • data driven
  • life cycle
  • manufacturing systems
  • adaptive learning
  • manufacturing industry
  • manufacturing environment