A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors.
Markus UlbrichtMario SchölzelTobias KoalHeinrich Theodor VierhausPublished in: DDECS (2011)
Keyphrases
- built in self test
- level parallelism
- integrated circuit
- high speed
- medical diagnosis
- fault diagnosis
- parallel processing
- model based diagnosis
- low cost
- signal processor
- multithreading
- parallel algorithm
- structural model
- hierarchical structure
- high performance computing
- instruction set
- memory bandwidth
- real time
- hierarchical model
- parallel computation
- single processor
- floating point
- traditional chinese medicine
- evolvable hardware
- memory subsystem