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Comparison of transient and static test methods for chip-to-sink thermal interface characterization.

Brian SmithThomas BrunschwilerBruno Michel
Published in: Microelectron. J. (2009)
Keyphrases
  • computational cost
  • data mining techniques
  • benchmark datasets
  • test data
  • statistical tests
  • data sets
  • feature selection
  • image processing
  • test cases
  • classification method
  • experimental design