Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing.

Vasileios Tenentes Xrysovalantis Kavousianos

Published in: ISVLSI (Selected papers) (2010)

Keyphrases

low power
power consumption
high speed
low cost
test cases
single chip
high power
wireless transmission
pattern matching
software testing
logic circuits
low power consumption
vlsi architecture
test suite
mixed signal
vlsi circuits
image sensor
power reduction
digital signal processing
power saving
delay insensitive