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A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint.

Ryoichi InoueToshinori HosokawaHideo Fujiwara
Published in: ATS (2008)
Keyphrases
  • generation method
  • finite state machines
  • database
  • data sets
  • machine learning
  • computer vision
  • knowledge base
  • multiscale
  • search algorithm
  • expert systems
  • evolutionary algorithm
  • test cases
  • test data