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An area-efficient dual replica-bitline delay technique for process-variation-tolerant low voltage SRAM sense amplifier timing.

Yi LiLiang WenYuejun ZhangXu ChengJun HanZhiyi YuXiaoyang Zeng
Published in: IEICE Electron. Express (2014)
Keyphrases
  • low voltage
  • cost effective
  • high speed
  • design process
  • low power
  • data flow
  • data transmission
  • power line