New word-line driving scheme for suppressing oxide-tunneling leakage in sub-65-nm SRAMs.

Ji-Hye Bong Yong-Jin Kwon Kyeong-Sik Min Sung-Mo Kang

Published in: ISQED (2009)

Keyphrases

leakage current
image processing
transmission electron microscopy
co occurrence
n gram
sentiment analysis
fuel cell
neural network
image sequences
information extraction
x ray
word pairs
room temperature