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New word-line driving scheme for suppressing oxide-tunneling leakage in sub-65-nm SRAMs.

Ji-Hye BongYong-Jin KwonKyeong-Sik MinSung-Mo Kang
Published in: ISQED (2009)
Keyphrases
  • leakage current
  • image processing
  • transmission electron microscopy
  • co occurrence
  • n gram
  • sentiment analysis
  • fuel cell
  • neural network
  • image sequences
  • information extraction
  • x ray
  • word pairs
  • room temperature