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Radiophysical processes in thin-film structures.

Dmitry A. BezuglovGeorge N. ShalamovGennady P. SinyavskyAlexander N. ZaichenkoLarissa V. CherckesovaOlga N. ManaenkovaAlexander G. Shein
Published in: EWDTS (2016)
Keyphrases
  • thin film
  • grain size
  • short circuit
  • high density
  • multi layer
  • electron microscopy
  • room temperature
  • white light interferometry
  • neural network
  • decision making
  • multi view