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Reliability of Cu nanoparticle joint for high temperature power electronics.

T. IshizakiA. KunoA. TaneM. YanaseF. OsawaT. SatohY. Yamada
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • high temperature
  • power electronics
  • single phase
  • neural network
  • artificial neural networks
  • fault diagnosis