Deep Learning Enables Large Depth-of-Field Images for Sub-Diffraction-Limit Scanning Superlens Microscopy.
Hui SunHao LuoFeifei WangQingjiu ChenMeng ChenXiaoduo WangHaibo YuGuanglie ZhangLianqing LiuJianping WangDapeng WuWen Jung LiPublished in: CoRR (2023)
Keyphrases
- deep learning
- electron microscopy
- image database
- three dimensional
- multiple images
- image features
- input image
- object recognition
- transmission electron microscopy
- x ray
- image annotation
- image classification
- image retrieval
- segmentation algorithm
- test images
- high resolution
- region of interest
- lighting conditions
- active learning