Selective-run built-in self-test using an embedded processor.
Sungbae HwangJacob A. AbrahamPublished in: ACM Great Lakes Symposium on VLSI (2002)
Keyphrases
- built in self test
- embedded processors
- embedded systems
- high speed
- neural network
- dynamic random access memory
- computer architecture
- parallel processing
- digital images
- multiscale
- information systems
- general purpose
- search algorithm
- video sequences
- integrated circuit
- watermarking algorithm
- distributed memory
- parallel processors
- parallel architectures
- control software
- search engine
- genetic algorithm
- data sets