Automated registration of low and high resolution atomic force microscopy images using scale invariant features.
Yun-feng WangJason I. KilpatrickSuzanne P. JarvisFrank BolandAnil C. KokaramDavid CorriganPublished in: ICIP (2014)
Keyphrases
- image registration
- scale invariant features
- high resolution
- rigid body
- high resolution images
- three dimensional
- image analysis
- registration process
- satellite images
- object recognition
- image matching
- laser scanner
- image retrieval
- input image
- low resolution
- keypoints
- atomic force microscopy
- image features
- scale invariant
- super resolution
- low resolution images
- higher resolution
- intensity based registration
- multiscale
- field of view
- feature points
- point cloud
- registration errors
- image processing
- spatial information
- micro ct
- remote sensing