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Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core.

Gang ZengHideo Ito
Published in: DFT (2003)
Keyphrases
  • test data
  • high speed
  • training data
  • test cases
  • test set
  • low cost
  • single chip
  • training set
  • data sets
  • data mining
  • search based testing
  • feature space
  • principal component analysis
  • training samples
  • embedded systems