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Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core.
Gang Zeng
Hideo Ito
Published in:
DFT (2003)
Keyphrases
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test data
high speed
training data
test cases
test set
low cost
single chip
training set
data sets
data mining
search based testing
feature space
principal component analysis
training samples
embedded systems