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CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application.
Masaki Hashizume
Masahiro Ichimiya
Hiroyuki Yotsuyanagi
Takeomi Tamesada
Published in:
Asian Test Symposium (2001)
Keyphrases
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defect detection
electric field
data sets
low power
real time
image processing
feature extraction
low cost
high speed
power consumption
application specific