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Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM.
Bing-Chuan Bai
Chun-Lung Hsu
Ming-Hsueh Wu
Chen-An Chen
Yee-Wen Chen
Kun-Lun Luo
Liang-Chia Cheng
James Chien-Mo Li
Published in:
Asian Test Symposium (2013)
Keyphrases
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back end
neural network
database
computer vision
statistical analysis
user friendly
information retrieval
information systems
preprocessing
high dimensional
data model
building blocks