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Techniques to Improve the Efficiency of SAT Based Path Delay Test Generation.

Kun BianD. M. H. WalkerSunil P. Khatri
Published in: VLSI Design (2014)
Keyphrases
  • test generation
  • shortest path
  • database
  • database systems
  • databases
  • case study
  • planning problems
  • answer set programming
  • quality assurance
  • symbolic execution