Reduced Scan Shift: A New Testing Method for Sequential Circuit.
Yoshinobu HigamiSeiji KajiharaKozo KinoshitaPublished in: ITC (1994)
Keyphrases
- preprocessing
- cost function
- high accuracy
- segmentation method
- objective function
- computational complexity
- test data
- classification method
- detection method
- pairwise
- computational cost
- input data
- mathematical model
- fully automatic
- image processing
- synthetic data
- error rate
- clustering method
- optimization algorithm
- evolutionary algorithm