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Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits.
Dina Kamel
Cédric Hocquet
François-Xavier Standaert
Denis Flandre
David Bol
Published in:
ESSCIRC (2010)
Keyphrases
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low voltage
analog vlsi
high speed
power supply
vlsi circuits
circuit design
delay insensitive
power consumption
energy minimization
energy efficiency
power system
asynchronous circuits
energy consumption
transmission line
random access memory