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An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration.

Xuan-Lun HuangJiun-Lang HuangHung-I ChenChang-Yu ChenTseng Kuo-TsaiMing-Feng HuangYung-Fa ChouDing-Ming Kwai
Published in: J. Electron. Test. (2012)
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