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A comparative study of low-noise logic cells for mixed mode integrated circuits.

Edgar AlbuquerqueManuel Silva
Published in: ISCAS (2000)
Keyphrases
  • integrated circuit
  • mixed mode
  • low signal to noise ratio
  • high noise
  • built in self test
  • signal to noise ratio
  • printed circuit boards
  • electron beam
  • modal logic
  • artificial intelligence
  • web services