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A gold nano-dot modified silicon tip apex for scanning Kelvin probe microscopy.
Chun-Ting Lin
Ching-Hao Chen
Chien-Ting Wu
Chien-Nan Hsiao
Ming-Hua Shiao
Mao-Nan Chang
Published in:
NEMS (2015)
Keyphrases
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electron microscopy
transmission electron microscopy
low cost
scan data
image analysis
high speed
neural network
nano scale
position and orientation
high throughput
image processing
image stacks
charge coupled device
microscopy images
image segmentation
fluorescence microscopy
real time