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Impact of FinFET on Near-Threshold Voltage Scalability.

Nathaniel Ross PinckneySupreet JelokaRonald G. DreslinskiTrevor N. MudgeDennis SylvesterDavid T. BlaauwLucian ShifrenBrian ClineSaurabh Sinha
Published in: IEEE Des. Test (2017)
Keyphrases
  • high impact
  • databases
  • power system
  • decision trees
  • case study
  • scalability issues
  • high voltage
  • search engine
  • multiscale
  • power supply