Combining symbolic and genetic techniques for efficient sequential circuit test generation.

Marco Boschini Xiaoming Yu Franco Fummi Elizabeth M. Rudnick

Published in: ETW (2000)

Keyphrases

test generation
circuit design
databases
artificial intelligence
design automation
static analysis
connectionist learning
data sets
symbolic execution
test sequences
data exchange
high speed
image data
data model
information technology
cooperative
high level
information systems