Login / Signup
Inductive Fault Analysis of MOS Integrated Circuits.
John Paul Shen
Wojciech Maly
F. Joel Ferguson
Published in:
IEEE Des. Test (1985)
Keyphrases
</>
integrated circuit
artificial intelligence
information systems
data analysis
image analysis
inductive learning
database
real time
databases
neural network
website
statistical analysis
quantitative analysis
manufacturing systems
electron beam