Investigation of STI diodes as electrostatic discharge (ESD) protection devices in deep submicron (DSM) CMOS process.

Thomas Au Marek Syrzycki

Published in: CCECE (2013)

Keyphrases

semiconductor devices
electron beam
mobile devices
embedded devices
vlsi circuits
fluidized bed
three dimensional
deep learning
x ray
design parameters
high speed
human computer interaction
low power
personal computer
high density
protection scheme