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Controlled Topological Transitions in Thin-Film Phase Separation.
Matthew G. Hennessy
Victor M. Burlakov
Alain Goriely
Barbara Wagner
Andreas Münch
Published in:
SIAM J. Appl. Math. (2015)
Keyphrases
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thin film
high density
short circuit
multi layer
solar cell
white light interferometry
grain size
databases
association rules
management system
d objects
software development
single image
electron microscopy
chance discovery
film thickness