Design benchmarking to 7nm with FinFET predictive technology models.
Saurabh SinhaBrian ClineGreg YericVikas ChandraYu CaoPublished in: ISLPED (2012)
Keyphrases
- case study
- predictive model
- neural network
- model selection
- design process
- design tools
- design decisions
- rapid development
- classification models
- metamodel
- design principles
- predictive modeling
- cost effective
- enabling technology
- low cost
- intellectual property
- design requirements
- design methodology
- statistical models
- complex systems
- computer systems
- information systems