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Testing of Interconnect Defects in Memory Based Reconfigurable Logic Device (MRLD).

Senling WangYoshinobu HigamiHiroshi TakahashiMasayuki SatoMitsunori KatsuShoichi Sekiguchi
Published in: ATS (2017)
Keyphrases
  • low cost
  • classical logic
  • modal logic
  • logic programming
  • high speed
  • test data
  • multistage
  • hardware implementation
  • defect detection
  • machine learning
  • software engineering
  • temporal logic
  • proof theory