Chip Speed Prediction Model for Optimization of Semiconductor Manufacturing Process Using Neural Networks and Statistical Methods.
Tae-Seon KimPublished in: ISNN (3) (2005)
Keyphrases
- prediction model
- statistical methods
- neural network
- manufacturing process
- statistical analysis
- quality control
- machine learning
- regression model
- process control
- fuzzy neural network
- printed circuit boards
- bp neural network
- product design
- statistical approaches
- machine learning methods
- statistical models
- control system
- manufacturing systems
- data mining techniques
- artificial neural networks
- product quality
- fuzzy logic
- back propagation
- machine vision
- neural network model
- image processing
- vision system
- metadata
- real time