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A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis.

Aiwu RuanShi KangYu WangXiao HanZujian ZhuYongbo LiaoPeng Li
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • built in self test
  • integrated circuit
  • fault diagnosis
  • medical diagnosis
  • real time
  • database