Radiation hardened pulsed-latches in 65-nm CMOS.
Jaspal Singh ShahManoj SachdevPublished in: CCECE (2016)
Keyphrases
- cmos technology
- low power
- silicon on insulator
- nm technology
- metal oxide semiconductor
- power consumption
- power dissipation
- x ray
- low cost
- high speed
- infrared
- transmission electron microscopy
- low voltage
- power supply
- circuit design
- single chip
- focal plane
- data sets
- database
- image sensor
- analog vlsi
- digital signal processing
- integrated circuit
- three dimensional
- neural network
- metal oxide