An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing].

Ugur Çilingiroglu Siew Kuok Hoon

Published in: IEEE Trans. Instrum. Meas. (2003)

Keyphrases

low voltage
duty cycle
short circuit
high speed
power system
energy dissipation
neural network
threshold selection
single phase
test cases
circuit design
threshold values
logic circuits
test data
test set
field effect transistors
case study
high voltage
genetic algorithm
real time