Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy.
Daichi TakeuchiKatsunori MakiharaMitsuhisa IkedaSeiichi MiyazakiHirokazu KakiTsukasa HayashiPublished in: IEICE Trans. Electron. (2013)