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Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique.
Vishal Jain
John A. Waicukauski
Published in:
ITC (2002)
Keyphrases
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test data
test set
test cases
training data
training set
low power
search based testing
data sets
error rate
unseen data
training and test data
face recognition
genetic algorithm
data model