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Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique.

Vishal JainJohn A. Waicukauski
Published in: ITC (2002)
Keyphrases
  • test data
  • test set
  • test cases
  • training data
  • training set
  • low power
  • search based testing
  • data sets
  • error rate
  • unseen data
  • training and test data
  • face recognition
  • genetic algorithm
  • data model