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Hierarchical test generation and design for testability methods for ASPPs and ASIPs.

Indradeep GhoshAnand RaghunathanNiraj K. Jha
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
  • test generation
  • case study
  • significant improvement
  • conceptual model
  • design automation
  • databases
  • information systems
  • user interface
  • design process