Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS).
Jian-Zhi ZhuFrançois FouquetBlaise RaveloA. AlaeddineMoncef KadiPublished in: Microelectron. Reliab. (2013)
Keyphrases
- transmission line
- computer simulation
- engineering and computer science
- reliability analysis
- power system
- earth science data
- search engine
- earth observing
- reliability assessment
- distribution networks
- highly reliable
- information systems
- databases
- power grid
- differential equations
- data collection
- electrical properties
- light emitting