Incremental Model-based Test Suite Reduction with Formal Concept Analysis.

Pin Ng Richard Y. K. Fung Ray W. M. Kong

Published in: J. Inf. Process. Syst. (2010)

Keyphrases

formal concept analysis
test suite reduction
concept lattice
formal concepts
conceptual clustering
test cases
binary data
galois lattices
test suite
association rules
itemsets
databases
data mining
knowledge discovery
neural network
data warehouse
classification rules
multiscale