Login / Signup
Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown.
Jianxin Fang
Sachin S. Sapatnekar
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
</>
empirical studies
machine learning methods
preprocessing
significant improvement
high speed
fault detection
methods require