High Quality ATPG for Delay Defects.

Puneet Gupta Michael S. Hsiao

Published in: ITC (2003)

Keyphrases

high quality
low quality
defect detection
ground truth
defect classification
higher quality
depth map
low resolution
image quality
high resolution
search algorithm
multiscale
database
highly accurate
high fidelity
feature extraction
critical path
automated visual inspection
yields high quality
data sets