Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability.
Andrea ViciFelice RussoNicola LovisiAldo MarchioniAntonio CasellaFernanda IrreraPublished in: ESSDERC (2019)
Keyphrases
- image sensor
- dynamic range
- video camera
- low power
- image processing algorithms
- single chip
- imaging systems
- hardware and software
- digital camera
- solid state
- motion blur
- cmos image sensor
- light source
- low cost
- machine vision
- power consumption
- high speed
- real time
- image formation
- vision system
- cmos technology
- charge coupled device