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Reliability analysis of logic circuits based on signal probability.
Denis Teixeira Franco
Maí Correia Vasconcelos
Lirida A. B. Naviner
Jean-François Naviner
Published in:
ICECS (2008)
Keyphrases
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reliability analysis
logic circuits
low power
functional decomposition
tunnel diode
signal processing
gate array
logic synthesis
real time
machine learning
low cost
model selection
optimization model
survival analysis
power dissipation