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Within-die gate delay variability measurement using re-configurable ring oscillator.
Bishnu Prasad Das
Bharadwaj Amrutur
H. S. Jamadagni
N. V. Arvind
V. Visvanathan
Published in:
CICC (2008)
Keyphrases
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measurement error
limit cycle
real world
image processing
case study
machine learning
multiscale
data acquisition
feedback loop
inter and intra observer