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Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection.

Binod KumarKanad BasuMasahiro FujitaVirendra Singh
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • neural network
  • signal processing
  • image processing
  • high frequency
  • localization error
  • higher level
  • error rate
  • field effect transistors