Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques.

Yunus Emre Chengen Yang Ketul Sutaria Yu Cao Chaitali Chakrabarti

Published in: SiPS (2012)

Keyphrases

levels of abstraction
data sets
real time
real world
social networks
information systems
high level
multiscale
expert systems
low cost
high speed
higher level
design considerations
reliability analysis