Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization.
Andrea BernieriGiovanni BettaLuigi FerrignoMarco LaraccaStefano MastrostefanoPublished in: IEEE Trans. Instrum. Meas. (2014)
Keyphrases
- databases
- support vector machine
- svm classifier
- multi class
- support vector
- database
- machine learning
- regression method
- feature vectors
- multi class support vector machines
- training data
- kernel methods
- support vector machine svm
- high classification accuracy
- small sample
- kernel function
- feature space
- radial basis function
- feature selection
- svm classification
- defect detection
- soft margin
- stock market prediction
- pattern recognition
- decision boundary
- information retrieval
- decision forest
- real world
- data sets