Test Pattern Compression for Probabilistic Circuits.

Chih-Ming Chang Kai-Jie Yang James Chien-Mo Li Hung Chen

Published in: ATS (2017)

Keyphrases

pattern matching
compression ratio
compression scheme
high speed
data driven
information systems
bayesian networks
test data
compression algorithm
circuit design
probabilistic model
image quality
conditional probabilities
data compression
probabilistic reasoning
lossy compression